METHOD FOR ADJUSTING A MEASURING DEVICE

The present application relates to a method for adjusting a measuring device for measuring a measurand of a medium using at least one measuring sensor, including: laboratory calibration of the measuring device in a calibration solution, laboratory calibration of the measuring device in air, determin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Iten, Daniel, Müller, Frank, Lindmüller, Peter
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present application relates to a method for adjusting a measuring device for measuring a measurand of a medium using at least one measuring sensor, including: laboratory calibration of the measuring device in a calibration solution, laboratory calibration of the measuring device in air, determination of a correction factor for correcting the laboratory calibration value of the measuring device in air to the laboratory calibration value of the measuring device in the calibration solution, on-site calibration of the measuring device in air, using the correction factor to correct the on-site calibration value of the measuring device in air, and on-site adjustment of the measuring device using the corrected on-site calibration value.