DEVICE AND METHOD FOR SPATIALLY MEASURING SURFACES
A device, for spatially measuring surfaces, includes a projector for projecting patterns into an object space, two cameras for recording pictures of a surface in the object space, and a control and evaluation unit for activating the cameras and evaluating the pictures. The projector includes a light...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A device, for spatially measuring surfaces, includes a projector for projecting patterns into an object space, two cameras for recording pictures of a surface in the object space, and a control and evaluation unit for activating the cameras and evaluating the pictures. The projector includes a light source, a projection lens, at least one rotatably arranged pattern structure, and a drive for rotating the at least one pattern structure. The control and evaluation unit to: activate the cameras for simultaneously recording a picture at each of a plurality of successive points in time; identify corresponding points in the picture planes of the cameras, by way of evaluating a correlation function between the sequences of brightness values acquired for potentially corresponding points and maximizing a value of the correlation; and determine spatial coordinates of surface points by way of triangulation on the basis of the identified corresponding points. |
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