FAULT DETECTION APPARATUS

A fault detection apparatus is provided, including a measurement unit that measures a first time period taken until a reflection signal reflected on a fault of a test apparatus is received after a first signal is transmitted to the test apparatus; a memory unit that includes a CAD data unit having C...

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Bibliographische Detailangaben
Hauptverfasser:	Murakami, Hiroaki, Seto, Motoshi
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING TRANSMISSION
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Beschreibung
Zusammenfassung:	A fault detection apparatus is provided, including a measurement unit that measures a first time period taken until a reflection signal reflected on a fault of a test apparatus is received after a first signal is transmitted to the test apparatus; a memory unit that includes a CAD data unit having CAD data of the test apparatus and a model data unit to store model data indicating a relation between the first time period and a predicted conduction distance of the first signal; a control unit that calculates a range of a test object selected in the test apparatus, calculates the predicted conduction distance from the first time period based on the model data, and specifies a position of the fault which is separated by the predicted conduction distance from the measurement unit in said range; and a display unit that displays the position of the fault.