MULTI-LAYER ANOMALY DETECTION FRAMEWORK

MULTI-LAYER ANOMALY DETECTION FRAMEWORK

According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from...

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Hauptverfasser: PATIL Sundeep R, BAPTISTA Oliver, MICHAEL Lutter, KLEINSTEUBER Martin, SAGEL Alexander, KAPIL Ansh
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator PATIL Sundeep R
BAPTISTA Oliver
MICHAEL Lutter
KLEINSTEUBER Martin
SAGEL Alexander
KAPIL Ansh
description According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from the machine associated with a second time period. An anomaly in the second plurality of data is determined.
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title MULTI-LAYER ANOMALY DETECTION FRAMEWORK
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