MULTI-LAYER ANOMALY DETECTION FRAMEWORK

According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from...

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Bibliographische Detailangaben
Hauptverfasser:	PATIL Sundeep R, BAPTISTA Oliver, MICHAEL Lutter, KLEINSTEUBER Martin, SAGEL Alexander, KAPIL Ansh
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	According to some embodiments, a system and method are provided to receive a first plurality of data from a machine associated with a first time period. A normal operation of the machine is automatically determined based on the first plurality of data. A second plurality of data may be received from the machine associated with a second time period. An anomaly in the second plurality of data is determined.