SEMICONDUCTOR STRUCTURE AND MANUFACUTING METHOD OF THE SAME

The present disclosure provides a semiconductor structure. The structure includes a first substrate; a first dielectric layer having a first surface in proximity to the first substrate and a second surface away from the first substrate; a first interconnect penetrating the first surface of the first...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIAO KENG-YING, CHEN PO-ZEN, CHIEN VOLUME, HSU YUNG-LUNG, TSENG CHUNG-BIN, TSAI TSUNG-HAN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides a semiconductor structure. The structure includes a first substrate; a first dielectric layer having a first surface in proximity to the first substrate and a second surface away from the first substrate; a first interconnect penetrating the first surface of the first dielectric layer; and a protection layer extending along a portion of a sidewall of the first interconnect. A thickness of the protection layer is in a range of from about 0.02 μm to about 0.2 μm.