METHOD AND DEVICE FOR DETECTING HILLOCK IN METAL LAYER

METHOD AND DEVICE FOR DETECTING HILLOCK IN METAL LAYER

The disclosure provides a method and a device for detecting a hillock in a metal layer, belongs to the technical field of hillock detection, and can solve the problem that the existing method for detecting a hillock in a metal layer is complicated, has low efficiency, and can hardly be used in actua...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHANG Xunze, XIAO Liang, PARK Sangsoo
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:The disclosure provides a method and a device for detecting a hillock in a metal layer, belongs to the technical field of hillock detection, and can solve the problem that the existing method for detecting a hillock in a metal layer is complicated, has low efficiency, and can hardly be used in actual production. The method for detecting a hillock in a metal layer in the present disclosure includes: collecting an optical image of the metal layer; adjusting contrast and brightness of the optical image; converting the adjusted optical image into a black-and-white image; and determining a black pixel in the black-and-white image as a spot of a corresponding hillock.