SYSTEMS AND METHODS FOR INDEXING AND DETECTING COMPONENTS

Systems and methods for defect detection and position control are described herein. A method of performing position control on members in a device may comprise applying, by a deposition device, a fiducial mark to a first member of the device, and receiving, by a processing unit, from an image captur...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Foley Michael G, Finn Alan Matthew
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Systems and methods for defect detection and position control are described herein. A method of performing position control on members in a device may comprise applying, by a deposition device, a fiducial mark to a first member of the device, and receiving, by a processing unit, from an image capture device coupled to the processing unit, an image of the first member. in various embodiments, the method may further comprise detecting, by the processing unit, the fiducial mark on the first member. In various embodiments, the fiducial mark may comprise ink.