Storage Anomaly Detection

The technology described in this document is, among other things, capable of efficiently monitoring storage device signal data for anomalies. In an example method, signal data for a plurality of non-transitory storage devices is collected. The method determines a hyper feature representation from th...

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Bibliographische Detailangaben
Hauptverfasser: Shivaji Shivkumar, Sudhakaran Ryan, Barajas Zamora Joel, Lee Yong Bum
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The technology described in this document is, among other things, capable of efficiently monitoring storage device signal data for anomalies. In an example method, signal data for a plurality of non-transitory storage devices is collected. The method determines a hyper feature representation from the collected signal data and computes, using the hyper feature representation, scores for statistics associated with the non-transitory storage devices. The method further determines a reduced hyper feature representation aggregating the scores for each of the statistics associated with each of the non-transitory storage devices; generates, using the reduced hyper feature representation, storage device scores for the non-transitory storage devices of the plurality, respectively; and identifies one or more non-transitory storage devices from among the plurality of non-transitory storage devices exhibiting anomalous storage device behavior using the storage device scores.