TEST APPARATUS WHICH TESTS SEMICONDUCTOR CHIPS

A test apparatus includes a motherboard including a first surface. The test apparatus further includes a handler including a second surface facing the first surface of the motherboard. The test apparatus additionally includes an adapter board disposed between the first surface of the motherboard and...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	JANG UNG JIN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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