SYSTEMS AND METHODS FOR SENSOR PLATFORM

Apparatus are provided for a sensor platform. The sensor platform includes a sensor mount adapted to receive a sensing device, and a first articulation system that has a first rotational axis. The sensor platform includes a second articulation system that has a second rotational axis, and the second...

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Bibliographische Detailangaben
1. Verfasser:	KO YUNGANG
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONTROLLING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS REGULATING SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES TARIFF METERING APPARATUS TESTING TRANSPORTING VEHICLES IN GENERAL VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISEPROVIDED FOR
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Beschreibung
Zusammenfassung:	Apparatus are provided for a sensor platform. The sensor platform includes a sensor mount adapted to receive a sensing device, and a first articulation system that has a first rotational axis. The sensor platform includes a second articulation system that has a second rotational axis, and the second rotational axis is different than the first rotational axis. The sensor platform includes a base that supports the first articulation system, the second articulation system and the sensor mount. The first articulation system and the second articulation system are independently movable to define two degrees of freedom for positioning the sensor platform.