Analyzer & Method for Loading a Rack Into a Rack Slot of an Analyzer

An analyzer is disclosed. The analyzer comprises a rack slot configured to receive at least one rack, wherein the rack slot comprises a front end, at which the rack is manually loadable into the rack slot, and a rear end, which is opposite to the front end and at which the rack is fully receivable i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Peter André, Sangermano Marco, Frey Rolf, Marty Christian, Birrer Armin
Format:	Patent
Sprache:	eng
Schlagworte:	DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An analyzer is disclosed. The analyzer comprises a rack slot configured to receive at least one rack, wherein the rack slot comprises a front end, at which the rack is manually loadable into the rack slot, and a rear end, which is opposite to the front end and at which the rack is fully receivable in the rack slot, and a spring device arranged at the rear end, wherein the spring device is configured to provide a biasing force towards the front end, wherein the biasing force is adapted to move the rack towards the front end if not fully received in the rack slot, wherein the spring device is configured to fix the rack in a final position if the rack is fully received in the rack slot. Further, a method for loading a rack into a rack slot of an analyzer and a system comprising an analyzer and a computer controller are disclosed.