THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAPE MEASURING METHOD, AND STORAGE MEDIUM

A projection unit configured to project a stripe pattern whose luminance changes periodically and a reference position pattern indicating a position of one period of a plurality of periods of the stripe pattern as a reference position; an image capturing unit configured to capture images of a measur...

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1. Verfasser: Seto Takamasa
Format: Patent
Sprache:eng
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Zusammenfassung:A projection unit configured to project a stripe pattern whose luminance changes periodically and a reference position pattern indicating a position of one period of a plurality of periods of the stripe pattern as a reference position; an image capturing unit configured to capture images of a measurement-target object; a control unit configured to control the projection unit and the image capturing unit, to acquire a captured image of the stripe pattern by performing control so that the image capturing unit captures images of the measurement-target object under a plurality of exposure conditions, and to acquire a captured image of the reference position pattern by performing control so that the image capturing unit captures images of the measurement-target object under exposure condition; and a shape calculation unit configured to calculate a three-dimensional shape object based on a captured image of the stripe pattern and the reference position pattern are included.