METHOD AND APPARATUS FOR MULTIPLE LOCALIZED INTERFEROMETRIC MEASUREMENTS

An optical sensing fiber includes multiple reference reflectors spaced along a length of the fiber. Each of the multiple reference reflectors producing a reference scattering event having a known scattering profile including an elevated amplitude relative to scattering detected for neighboring segme...

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Bibliographische Detailangaben
Hauptverfasser:	KLEIN Justin W, TEMPLETON Emily E.H, LALLY Evan M
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An optical sensing fiber includes multiple reference reflectors spaced along a length of the fiber. Each of the multiple reference reflectors producing a reference scattering event having a known scattering profile including an elevated amplitude relative to scattering detected for neighboring segments of the optical fiber. Each of the segments is a length of contiguous fiber that is useable to initialize and perform a distributed Optical Frequency Domain Reflectometry (OFDR) sensing operation. An OFDR interrogation system is disclosed that measures a parameter using the optical sensing fiber.