METHODS AND APPARATUS FOR INTERFEROMETRIC INTERROGATION OF AN OPTICAL SENSOR

A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measureme...

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Bibliographische Detailangaben
Hauptverfasser:	PEDRAZZANI Janet Renee, LALLY Evan M, DAVIS Matthew
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A high-speed interrogation system is provided for interferometric sensors, one example of which is an EFPI sensor, that operates based on spectral interference. The system uses a two mode operation that includes a lower speed, accurate absolute measurement mode and a higher speed, relative measurement mode. The system achieves greater overall measurement accuracy and speed than known sensor interrogation approaches.