IMAGING SYSTEMS AND METHODS INCLUDING OBSCURANT CHARACTERIZATION

Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the fol...

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Hauptverfasser:	HIRIYANNAIAH HARISH P, TANG NANSHENG
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS
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creator	HIRIYANNAIAH HARISH P TANG NANSHENG
description	Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. The method further includes adjusting one or more parameters of an imagining system based at least in part on a characterization of the at least one obscurant.
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In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. The method further includes adjusting one or more parameters of an imagining system based at least in part on a characterization of the at least one obscurant.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170824&DB=EPODOC&CC=US&NR=2017243079A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170824&DB=EPODOC&CC=US&NR=2017243079A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRIYANNAIAH HARISH P</creatorcontrib><creatorcontrib>TANG NANSHENG</creatorcontrib><title>IMAGING SYSTEMS AND METHODS INCLUDING OBSCURANT CHARACTERIZATION</title><description>Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. 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In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. The method further includes adjusting one or more parameters of an imagining system based at least in part on a characterization of the at least one obscurant.</abstract><oa>free_for_read</oa></addata></record>
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subjects	CALCULATING COMPUTING COUNTING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS
title	IMAGING SYSTEMS AND METHODS INCLUDING OBSCURANT CHARACTERIZATION
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