IMAGING SYSTEMS AND METHODS INCLUDING OBSCURANT CHARACTERIZATION

IMAGING SYSTEMS AND METHODS INCLUDING OBSCURANT CHARACTERIZATION

Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the fol...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HIRIYANNAIAH HARISH P, TANG NANSHENG
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Beschreibung
Zusammenfassung:Systems and methods for characterizing an obscurant and imaging a target are disclosed. In one embodiment, a method of imaging a target includes characterizing at least one obscurant present in an environment, and determining, based on the at least one characterized obscurant, one or more of the following: one or more wavelengths corresponding to the at least one obscurant, a polarization state corresponding to the at least one obscurant, and a sensor exposure time corresponding to the at least one obscurant. The method further includes adjusting one or more parameters of an imagining system based at least in part on a characterization of the at least one obscurant.