INTEGRATED CIRCUIT (IC) DESIGN ANALYSIS AND FEATURE EXTRACTION

INTEGRATED CIRCUIT (IC) DESIGN ANALYSIS AND FEATURE EXTRACTION

Various embodiments include approaches for analyzing integrated circuit (IC) designs. In some cases, an approach includes: defining extraction parameters for the design of the IC for each of a set of failure modes; testing the design of the IC for a failure mode in the set of failure modes; identify...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Chidambarrao Dureseti, Jagannathan Basanth, Baiocco Christopher V, Nanjundappa Haraprasad, Chadwick Laura S
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Various embodiments include approaches for analyzing integrated circuit (IC) designs. In some cases, an approach includes: defining extraction parameters for the design of the IC for each of a set of failure modes; testing the design of the IC for a failure mode in the set of failure modes; identifying a defined extraction parameter from the design of the IC for at least one of the set of failure modes; correlating the identified defined extracted parameter and each of the at least one failure mode for the design of the IC; and creating a normalized parameter equation representing the correlation of the identified defined extraction parameter with the at least one failure mode for the design of the IC in numerical form.