DATA MANAGEMENT APPARATUS AND MONITORING METHOD OF SAME

A data management apparatus according to an embodiment of the present invention includes a data analyzing unit that processes operation data transferred from a data collecting unit that collects the operation data of a semiconductor manufacturing apparatus, and a state monitoring unit that monitors...

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Bibliographische Detailangaben
Hauptverfasser: SHIRAISHI Daisuke, KAGOSHIMA Akira, NAGATANI Yuji
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A data management apparatus according to an embodiment of the present invention includes a data analyzing unit that processes operation data transferred from a data collecting unit that collects the operation data of a semiconductor manufacturing apparatus, and a state monitoring unit that monitors a state of the data analyzing unit based on monitoring time. The monitoring time is the sum of first time that is time required for transferring the operation data to the data analyzing unit and second time that is time required for processing the operation data in the data analyzing unit.