Method of Manufacturing Semiconductor Devices Including Deposition of Crystalline Silicon in Trenches

Trenches are formed in a semiconductor layer of a semiconductor substrate. A mixture that contains trichlorosilane and hydrogen gas is fed into a process chamber containing the semiconductor substrate. A barometric pressure in the process chamber is at least 50% of standard atmosphere. The trenches...

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Bibliographische Detailangaben
Hauptverfasser: Baumgartl Johannes, Kuenle Matthias
Format: Patent
Sprache:eng
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Zusammenfassung:Trenches are formed in a semiconductor layer of a semiconductor substrate. A mixture that contains trichlorosilane and hydrogen gas is fed into a process chamber containing the semiconductor substrate. A barometric pressure in the process chamber is at least 50% of standard atmosphere. The trenches are filled with epitaxially deposited crystalline silicon.