INITIAL STRESS AND EIGENSTRAIN COMPUTATION SYSTEM AND METHOD

A system and method are provided for estimating initial stresses in and eigenstrains of a material. The system may receive measured geometric data including measurements of a material before and after the application of a manufacturing process thereto. The measurements may indicate a residual stress...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Nervi Sebastian, Bolin Jared L, Castle James B
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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