INITIAL STRESS AND EIGENSTRAIN COMPUTATION SYSTEM AND METHOD

A system and method are provided for estimating initial stresses in and eigenstrains of a material. The system may receive measured geometric data including measurements of a material before and after the application of a manufacturing process thereto. The measurements may indicate a residual stress...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Nervi Sebastian, Bolin Jared L, Castle James B
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A system and method are provided for estimating initial stresses in and eigenstrains of a material. The system may receive measured geometric data including measurements of a material before and after the application of a manufacturing process thereto. The measurements may indicate a residual stress in a coupon after application of the manufacturing process. Estimated linear elastic strains may be calculated in respective opposing sides of the coupon based on the measured geometric data. A linear elastic reaction of the material to the manufacturing process may be calculated based at least in part on the estimated linear elastic strains. The system may then calculate an estimated initial stress in the material as a sum of the residual stress in the coupon and the linear elastic reaction of the material, and calculate an estimated eigenstrain of the material based at least in part on the estimated initial stress in the material.