INSPECTION PROGRAM EDITING ENVIRONMENT INCLUDING INTEGRATED ALIGNMENT PROGRAM PLANNING AND EDITING FEATURES

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-D view of a workpiece; an editing user interface portion comp...

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Bibliographische Detailangaben
Hauptverfasser:	Ade Guenther, Madsen Frank Uwe, Brieger Petra
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-D view of a workpiece; an editing user interface portion comprising an editable plan representation of a current workpiece feature inspection plan for the workpiece; and an editable alignment program plan representation for the workpiece. The system is configured with the editable alignment program plan representation being automatically responsive to editing operations, regardless of whether the editing operations are performed in the 3-D view or the editable plan representation. The editing operations include deleting or adding at least one workpiece feature to or from the editable alignment program plan representation.