SYSTEMS AND METHODS FOR GENERATING PATHS FOR PROCESSING PHYSICAL PROFILES OF PARTS

SYSTEMS AND METHODS FOR GENERATING PATHS FOR PROCESSING PHYSICAL PROFILES OF PARTS

A method (100) of generating a path (470) for processing a physical profile (230) of a part (200) with a tool (303) is provided. The physical profile (230) has a shape. The method (100) comprises identifying a processing location (440a) on the physical profile (230) of the part (200). The processing...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Trend Don D, Guirguis Martin Hanna
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method (100) of generating a path (470) for processing a physical profile (230) of a part (200) with a tool (303) is provided. The physical profile (230) has a shape. The method (100) comprises identifying a processing location (440a) on the physical profile (230) of the part (200). The processing location (440a) is within an inspection region (450a). The method (100) also comprises identifying an inspection-region location (460b) based on the processing location (440a). An inspection region (450b) is geometrically associated with the inspection-region location (460b). The method (100) additionally comprises identifying a processing location (440b) on the physical profile (230) of the part (200). The processing location (440b) is within the inspection region (450b). The method (100) also comprises generating at least a portion of the path (470) based on the processing location (440a) and the processing location (440b).