COUPLING LOSS EVALUATION

The exemplary systems, apparatus, structures, and methods may include an assembly including substrate, an optical waveguide, and an optical access associated with the optical waveguide. Light from the optical access may be measured along the optical waveguide. The coupling loss of the optical wavegu...

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Bibliographische Detailangaben
1. Verfasser:	Pitwon Richard C. A
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	The exemplary systems, apparatus, structures, and methods may include an assembly including substrate, an optical waveguide, and an optical access associated with the optical waveguide. Light from the optical access may be measured along the optical waveguide. The coupling loss of the optical waveguide may be determined based on at least the light measurements from the optical access.