USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM

A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then b...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Chikhradze Besarion, Muchaidze Giorgi, Kajbaf Hamed
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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