USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM

USING COMPUTER-AIDED DESIGN LAYOUT IN SCANNING SYSTEM

A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then b...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Chikhradze Besarion, Muchaidze Giorgi, Kajbaf Hamed
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.