APPARATUS AND METHODS TO DETECT SEMICONDUCTOR DEVICE DEGRADATION DUE TO RADIATION EXPOSURE
Apparatus and methods to detect degradation due to radiation exposure are described. An example method to detect circuit failure due to radiation exposure includes determining a current of a semiconductor device in an analog circuit, determining an amount of radiation to which the semiconductor devi...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Apparatus and methods to detect degradation due to radiation exposure are described. An example method to detect circuit failure due to radiation exposure includes determining a current of a semiconductor device in an analog circuit, determining an amount of radiation to which the semiconductor device has been exposed based on the current, comparing the amount of radiation to a radiation dose threshold value, and indicating a degradation of the semiconductor device based on the comparison. |
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