Modular Data Storage Device Testing System

Modular Data Storage Device Testing System

A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port por...

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Hauptverfasser: Rancour Michael Louis, Herdendorf Brett Robert, Anderson Ronald Eldon
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
PHYSICS
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creator Rancour Michael Louis
Herdendorf Brett Robert
Anderson Ronald Eldon
description A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016379681A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016379681A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016379681A13</originalsourceid><addsrcrecordid>eNrjZNDyzU8pzUksUnBJLElUCC7JL0pMT1VwSS3LTE5VCEktLsnMS1cIriwuSc3lYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoZmxuaWZhaGjobGxKkCAJvoKZE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Modular Data Storage Device Testing System</title><source>esp@cenet</source><creator>Rancour Michael Louis ; Herdendorf Brett Robert ; Anderson Ronald Eldon</creator><creatorcontrib>Rancour Michael Louis ; Herdendorf Brett Robert ; Anderson Ronald Eldon</creatorcontrib><description>A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.</description><language>eng</language><subject>INFORMATION STORAGE ; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER ; PHYSICS</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161229&amp;DB=EPODOC&amp;CC=US&amp;NR=2016379681A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161229&amp;DB=EPODOC&amp;CC=US&amp;NR=2016379681A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Rancour Michael Louis</creatorcontrib><creatorcontrib>Herdendorf Brett Robert</creatorcontrib><creatorcontrib>Anderson Ronald Eldon</creatorcontrib><title>Modular Data Storage Device Testing System</title><description>A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.</description><subject>INFORMATION STORAGE</subject><subject>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDyzU8pzUksUnBJLElUCC7JL0pMT1VwSS3LTE5VCEktLsnMS1cIriwuSc3lYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoZmxuaWZhaGjobGxKkCAJvoKZE</recordid><startdate>20161229</startdate><enddate>20161229</enddate><creator>Rancour Michael Louis</creator><creator>Herdendorf Brett Robert</creator><creator>Anderson Ronald Eldon</creator><scope>EVB</scope></search><sort><creationdate>20161229</creationdate><title>Modular Data Storage Device Testing System</title><author>Rancour Michael Louis ; Herdendorf Brett Robert ; Anderson Ronald Eldon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016379681A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>INFORMATION STORAGE</topic><topic>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Rancour Michael Louis</creatorcontrib><creatorcontrib>Herdendorf Brett Robert</creatorcontrib><creatorcontrib>Anderson Ronald Eldon</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rancour Michael Louis</au><au>Herdendorf Brett Robert</au><au>Anderson Ronald Eldon</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Modular Data Storage Device Testing System</title><date>2016-12-29</date><risdate>2016</risdate><abstract>A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.</abstract><oa>free_for_read</oa></addata></record>
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subjects INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
PHYSICS
title Modular Data Storage Device Testing System
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T01%3A01%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Rancour%20Michael%20Louis&rft.date=2016-12-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2016379681A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true