Modular Data Storage Device Testing System

A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port por...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Rancour Michael Louis, Herdendorf Brett Robert, Anderson Ronald Eldon
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.