CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (Sech) transmitted through this sample, located in an X and/or gamma spectral band, naled spectrum transmitted thro...

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Bibliographische Detailangaben
Hauptverfasser:	BRAMBILLA Andrea, POTOP Alexandra, GORECKI Alexia
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (Sech) transmitted through this sample, located in an X and/or gamma spectral band, naled spectrum transmitted through the sample; for each spectrum of a plurality of calibration spectra (Sbase(Lk; Ll)), calculating a likelihood from said calibration spectrum (Sbase(Lk; Ll)), and from the spectrum transmitted through the sample (Sech), each calibration spectrum (Sbase(Lk; Ll)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; estimating the characteristic thicknesses (L1, L2) associated with the sample according to the criterion of maximum likelihood.