IDENTIFYING A SELECTED FEATURE ON TESSELLATED GEOMETRY
A method for identifying and measuring a feature on tessellated geometry may include providing an image of a part on a display using an electronic representation of the part. The part may include a tessellated geometry. The electronic representation of the tessellated geometry of the part may includ...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A method for identifying and measuring a feature on tessellated geometry may include providing an image of a part on a display using an electronic representation of the part. The part may include a tessellated geometry. The electronic representation of the tessellated geometry of the part may include a collection of triangles defined by vertices of each triangle. The method may also include receiving selection of a feature on the tessellated geometry of the part. A first triangle of the collection of triangles that is associated with the selected feature is chosen and at least a first vertex and a second vertex of the first triangle are determined. A predefined normal to each of the vertices is also determined. The predefined normals from at least two of the vertices are used to identify and measure the feature of the part. |
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