METHOD AND APPARATUS FOR DETECTING PARTICULATE MATTER
Various methods and apparatuses for detecting particulate matter are described herein. An illustrative apparatus may include a diode laser positioned adjacent to a first end of an optical cavity having a length. The diode laser may be configured to direct a light beam in a direction towards a second...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Various methods and apparatuses for detecting particulate matter are described herein. An illustrative apparatus may include a diode laser positioned adjacent to a first end of an optical cavity having a length. The diode laser may be configured to direct a light beam in a direction towards a second end of the optical cavity. A plurality of detectors may be positioned along the length of the optical cavity in the direction of the light beam. Each detector may be configured to measure a portion of the light beam that is scattered substantially perpendicular to the direction. The apparatus may also include a computing device that is configured to receive data from each of the plurality of detectors and a data transmitting device that is configured to transmit the data to a portable electronic device. The data may correspond to an amount of measured scattered light. |
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