RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF

and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2...

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Hauptverfasser: STRUYE Luc, ELEN Sabina, VANDENBROUCKE Dirk, TAHON Jean-Pierre
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creator STRUYE Luc
ELEN Sabina
VANDENBROUCKE Dirk
TAHON Jean-Pierre
description and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2,k3 . . . represent mass attenuation coefficients of the elements. If the chemical compound is a scintillating phosphor, a layer is present between the X-ray absorbing layer and the substrate and has a transmission for light of 10% or lower at the wavelength of the light emission of the chemical compound.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2016322411A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2016322411A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2016322411A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEuDqK-w4FzwbTifjSXJhBzJb1aO5UicRIt1PdHBB_A6R--f52liNpxHbGxAxiPAg0G8qBJqBKOYPHiQg0InnvoydVW4JpHHKC1jrwGDBrEEpxJLGtgA01k3VXiOHwhEptttrpPjyXtft1ke0NS2TzNrzEt83RLz_Qeu7Y4qFNZFEelUJX_XR8VfTU3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF</title><source>esp@cenet</source><creator>STRUYE Luc ; ELEN Sabina ; VANDENBROUCKE Dirk ; TAHON Jean-Pierre</creator><creatorcontrib>STRUYE Luc ; ELEN Sabina ; VANDENBROUCKE Dirk ; TAHON Jean-Pierre</creatorcontrib><description>and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2,k3 . . . represent mass attenuation coefficients of the elements. If the chemical compound is a scintillating phosphor, a layer is present between the X-ray absorbing layer and the substrate and has a transmission for light of 10% or lower at the wavelength of the light emission of the chemical compound.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161103&amp;DB=EPODOC&amp;CC=US&amp;NR=2016322411A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161103&amp;DB=EPODOC&amp;CC=US&amp;NR=2016322411A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STRUYE Luc</creatorcontrib><creatorcontrib>ELEN Sabina</creatorcontrib><creatorcontrib>VANDENBROUCKE Dirk</creatorcontrib><creatorcontrib>TAHON Jean-Pierre</creatorcontrib><title>RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF</title><description>and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2,k3 . . . represent mass attenuation coefficients of the elements. If the chemical compound is a scintillating phosphor, a layer is present between the X-ray absorbing layer and the substrate and has a transmission for light of 10% or lower at the wavelength of the light emission of the chemical compound.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEuDqK-w4FzwbTifjSXJhBzJb1aO5UicRIt1PdHBB_A6R--f52liNpxHbGxAxiPAg0G8qBJqBKOYPHiQg0InnvoydVW4JpHHKC1jrwGDBrEEpxJLGtgA01k3VXiOHwhEptttrpPjyXtft1ke0NS2TzNrzEt83RLz_Qeu7Y4qFNZFEelUJX_XR8VfTU3</recordid><startdate>20161103</startdate><enddate>20161103</enddate><creator>STRUYE Luc</creator><creator>ELEN Sabina</creator><creator>VANDENBROUCKE Dirk</creator><creator>TAHON Jean-Pierre</creator><scope>EVB</scope></search><sort><creationdate>20161103</creationdate><title>RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF</title><author>STRUYE Luc ; ELEN Sabina ; VANDENBROUCKE Dirk ; TAHON Jean-Pierre</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2016322411A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>STRUYE Luc</creatorcontrib><creatorcontrib>ELEN Sabina</creatorcontrib><creatorcontrib>VANDENBROUCKE Dirk</creatorcontrib><creatorcontrib>TAHON Jean-Pierre</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STRUYE Luc</au><au>ELEN Sabina</au><au>VANDENBROUCKE Dirk</au><au>TAHON Jean-Pierre</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF</title><date>2016-11-03</date><risdate>2016</risdate><abstract>and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2,k3 . . . represent mass attenuation coefficients of the elements. If the chemical compound is a scintillating phosphor, a layer is present between the X-ray absorbing layer and the substrate and has a transmission for light of 10% or lower at the wavelength of the light emission of the chemical compound.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T23%3A05%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STRUYE%20Luc&rft.date=2016-11-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2016322411A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true