RADIOGRAPHY FLAT PANEL DETECTOR HAVING A LOW WEIGHT X-RAY SHIELD AND THE METHOD OF PRODUCTION THEREOF

and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2...

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Bibliographische Detailangaben
Hauptverfasser:	STRUYE Luc, ELEN Sabina, VANDENBROUCKE Dirk, TAHON Jean-Pierre
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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Zusammenfassung:	and AE(Am241 60 keV) represents the absorption exponent of the X-ray absorbing layer relative to the about 60 keV gamma ray emission of Am241; t represents the a thickness of the X-ray absorbing layer; e1, e2, e3, . . . represent concentrations of the elements in the X-ray absorbing layer; and k1,k2,k3 . . . represent mass attenuation coefficients of the elements. If the chemical compound is a scintillating phosphor, a layer is present between the X-ray absorbing layer and the substrate and has a transmission for light of 10% or lower at the wavelength of the light emission of the chemical compound.