DATA STORAGE COMPONENT TEST DECK SYSTEM

A system may utilize at least an enclosed test deck that has an access port door covering an access port. The system can test a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port doo...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Rancour Michael Louis, Herdendorf Brett Robert, Anderson Ronald Eldon
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A system may utilize at least an enclosed test deck that has an access port door covering an access port. The system can test a data storage component by presenting the enclosed test deck to an exchange assembly before exposing an interior test region of the test deck by engaging the access port door with a tool of the exchange assembly. At least one data storage component may be installed into the interior test region and subsequently the access port is closed by installing the access port door into the access port.