QUALITY PREDICTION

A set of predicted binary quality indexes is created from a sample set of application lifecycle information and customer encountered defects (CED) for each module id and revision (rev) pair for each application. Normalized effort and quality related factors are extracted for each module id and rev p...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Toplian Yaniv, Kour George, Vinik Alon
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A set of predicted binary quality indexes is created from a sample set of application lifecycle information and customer encountered defects (CED) for each module id and revision (rev) pair for each application. Normalized effort and quality related factors are extracted for each module id and rev pair of each application. A binary quality index is created based on a set of weighted CED ratings for each module id and rev pair of each application. A prediction model for the binary quality index is created by training a decision tree-based classifier with the sample set to create a set of prediction weights for each effort and quality factor. The set of prediction weights is applied to the effort and quality related factors to each module id and rev pair of an application under-development to create the set of predicted binary quality indexes.