ARRAY SUBSTRATE, TESTING METHOD, DISPLAY PANEL AND DISPLAY APPARATUS

The present disclosure provides an array substrate, a testing method, a display panel and a display apparatus. The array substrate includes: multiple gate wires and data wires intersecting with each other to divide multiple sub-pixel regions, where the sub-pixels corresponding to each of the data wi...

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Bibliographische Detailangaben
1. Verfasser:	Ma Conghua
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION BASIC ELECTRIC ELEMENTS CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS SEMICONDUCTOR DEVICES TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
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Beschreibung
Zusammenfassung:	The present disclosure provides an array substrate, a testing method, a display panel and a display apparatus. The array substrate includes: multiple gate wires and data wires intersecting with each other to divide multiple sub-pixel regions, where the sub-pixels corresponding to each of the data wires form a column of the sub-pixels, and M neighboring columns of the sub-pixels form a sub-pixel group; multiple switch units, where a first end of each of the switch units is electrically connected to one of the data wires; and multiple testing ends, each of which is electrically connected to second ends of the switch units. In such configuration, at least two switch units are electrically connected to the data wires corresponding to ith columns of the sub-pixels in at least two alternately arranged sub-pixel groups, respectively. Accordingly, impacts to voltage of common electrodes may be avoided and testing effect may be improved.