Reconstruction Of Scanning Probe Microscopy Cantilever Tip

A method for reconstructing a scanning probe microscopy (SPM) cantilever tip using focused ion beam (FIB) milling, such as reconstructing an atomic force microscopy (AFM) tip for reuse, involves mounting a used cantilever with tip and tip point on a FIB stub cantilever holder, thereby exposing the t...

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Bibliographische Detailangaben

Hauptverfasser:	Borromeo Noreen Grace A, Lopez Jessica Irish D, Rato Jovy Anne V
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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