AUTOMATED SYSTEM AND METHOD FOR DETECTING DEFECTIVE EDGES OF PRINTED CIRCUIT BOARDS AND OTHER OBJECTS USING MULTIPLE SENSORS

An automated system and method for detecting substantial edge defects on an object that can degrade or impede proper object performance. The defects, such as chips, cracks, or bumps, if sufficiently substantial, can interfere with the proper operation of the object. The inspection may be performed w...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Takahashi Shinrin, Imanishi Tasuku
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!