AUTOMATED SYSTEM AND METHOD FOR DETECTING DEFECTIVE EDGES OF PRINTED CIRCUIT BOARDS AND OTHER OBJECTS USING MULTIPLE SENSORS

An automated system and method for detecting substantial edge defects on an object that can degrade or impede proper object performance. The defects, such as chips, cracks, or bumps, if sufficiently substantial, can interfere with the proper operation of the object. The inspection may be performed w...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Takahashi Shinrin, Imanishi Tasuku
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	An automated system and method for detecting substantial edge defects on an object that can degrade or impede proper object performance. The defects, such as chips, cracks, or bumps, if sufficiently substantial, can interfere with the proper operation of the object. The inspection may be performed with four electronic sensors, two on each side of the object, or with two electronic sensors that each take two sets of measurements spaced apart by a certain time interval. Sensor measurements are periodically obtained and used by a controller to calculate a value based on the four sensor measurements. The calculated value is compared to a threshold to determine whether or not any defects are significant.