PROJECTION EXPOSURE APPARATUS COMPRISING A MANIPULATOR, AND METHOD FOR CONTROLLING A PROJECTION EXPOSURE APPARATUS

A method for controlling a microlithographic projection exposure apparatus includes: determining a wavefront error of the projection exposure apparatus; generating a travel vector, suitable for correcting the wavefront error, with travels for each zone of the optical manipulator; establishing a cons...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Walter Holger, Bittner Boris
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method for controlling a microlithographic projection exposure apparatus includes: determining a wavefront error of the projection exposure apparatus; generating a travel vector, suitable for correcting the wavefront error, with travels for each zone of the optical manipulator; establishing a constraint parameter with respect to the travel for at least one zone of the optical manipulator; and checking the travels of the generated travel vector with respect to implementability.