Method and Apparatus for Multi-Stage Spar Assembly

A method and apparatus for positioning one component relative to another component. First metrology data may be identified for a first component and second metrology data may be identified for a second component. First locations of first features may be identified on the first component using the fi...

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Hauptverfasser: BROCKWAY MONICA JOY, JONES DARRELL DARWIN, SISCO TANNI, MURPHY JAMES C, CAI FEI, BOLTON VICTOR JOSEPH, SMITH, JR. DANIEL RICHARD, HALL THOMAS DEE, PATTON ERIC SCOTT, MUNK CLAYTON LYNN, STONE PAUL REED
Format: Patent
Sprache:eng
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Zusammenfassung:A method and apparatus for positioning one component relative to another component. First metrology data may be identified for a first component and second metrology data may be identified for a second component. First locations of first features may be identified on the first component using the first metrology data. Second locations of second features on the second component may be identified using the second metrology data. A transformation may be computed based on the first locations identified and the second locations identified for use in modifying a movement plan of a robotic system for positioning the second component relative to the first component.