SYSTEM AND METHOD FOR DETECTING A DEFECT IN A WORKPIECE UNDERGOING MATERIAL PROCESSING BY AN ENERGY POINT SOURCE

A method for detecting a subsurface defect in a workpiece undergoing processing includes directing focused heat energy from an energy point source on to the workpiece to generate a melt pool and cause a solid portion of the workpiece to emit incandescent radiation. The incandescent radiation emitted...

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Bibliographische Detailangaben
Hauptverfasser: SPARKS TODD E, LIOU FUEWEN FRANK
Format: Patent
Sprache:eng
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Zusammenfassung:A method for detecting a subsurface defect in a workpiece undergoing processing includes directing focused heat energy from an energy point source on to the workpiece to generate a melt pool and cause a solid portion of the workpiece to emit incandescent radiation. The incandescent radiation emitted by the solid portion of the workpiece is captured and a signal based upon the color or intensity of the captured incandescent radiation is output. A processor receives the output signal and analyzes it for any variance. If any variance is detected, the region associated with the variance is determined. In this fashion, gradients in the color or intensity distribution reveal subsurface defects.