DYNAMIC METERING ADJUSTMENT FOR SERVICE MANAGEMENT OF COMPUTING PLATFORM

Systems and methods are provided for dynamic metering adjustment for service management of a computing platform. For example, a plurality of virtual machines are provisioned across a plurality of computing nodes of a computing platform. Data samples are collected for a metric that is monitored with...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KOCHUT ANDRZEJ, SAILER ANCA, ANWAR ALI, SEGAL ALLA, SCHULZ CHARLES O
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Systems and methods are provided for dynamic metering adjustment for service management of a computing platform. For example, a plurality of virtual machines are provisioned across a plurality of computing nodes of a computing platform. Data samples are collected for a metric that is monitored with regard to resource utilization in the computing platform by the virtual machines. The data samples are initially collected at a predefined sampling frequency. The data samples collected over time for the metric are analyzed to determine an amount of deviation in values of the collected data samples. A new sampling frequency is determined for collecting data samples for the metric based on the determined amount of deviation. The new sampling frequency is applied to collect data samples for the metric, wherein the new sampling frequency is less than the predefined sampling frequency.