COPPER CLEANING AND PROTECTION FORMULATIONS

A cleaning composition and process for cleaning post-chemical mechanical polishing (CMP) residue and contaminants from a microelectronic device having said residue and contaminants thereon. The cleaning compositions include corrosion inhibitor(s) and surfactant(s). The composition achieves highly ef...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MEDD STEVEN, WRSCHKA PETER, LIU JUN, SUN LAISHENG, BARNES JEFFREY A, THOMAS ELIZABETH
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A cleaning composition and process for cleaning post-chemical mechanical polishing (CMP) residue and contaminants from a microelectronic device having said residue and contaminants thereon. The cleaning compositions include corrosion inhibitor(s) and surfactant(s). The composition achieves highly efficacious cleaning of the post-CMP residue and contaminant material from the surface of the microelectronic device without compromising the low-k dielectric material or the copper interconnect material.