APPARATUS AND METHOD FOR EARLY DETECTION OF ABNORMALITY

APPARATUS AND METHOD FOR EARLY DETECTION OF ABNORMALITY

Disclosed are an apparatus and method for detecting an abnormality early. An apparatus for detecting the abnormality early includes a similar case selector configured to select similar cases associated with a monitored target from among previous case data, a data collector configured to collect stat...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KIM SUNGIL, KIM YOONHEOK, RYU JEWOUN, JEONG GOWUN, LEE SUNG WOO, PARK YONGRO
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:Disclosed are an apparatus and method for detecting an abnormality early. An apparatus for detecting the abnormality early includes a similar case selector configured to select similar cases associated with a monitored target from among previous case data, a data collector configured to collect status information of the monitored target, an abnormality detector configured to generate a baseline for detecting the abnormality of the monitored target from case data classified as normal among the previous case data and compare the baseline with the collected status information to detect whether the monitored target has the abnormality, and a predictor configured to, when it is detected that the monitored target has the abnormality, compare each of the selected similar cases with the collected status information to select an optimum similar case associated with the monitored target among the similar cases, and to predict a future situation development of the monitored target based on the optimum similar case.