SEMICONDUCTOR DEVICE

According to an embodiment, a semiconductor device includes a semiconductor element that is formed on a semiconductor substrate, an interlayer insulating film, including a silicon oxide film, that is formed to cover the semiconductor element, a wiring layer, including a metal, that is formed in the...

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Bibliographische Detailangaben
Hauptverfasser: MURATA TAKESHI, KUGE NOBUHITO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:According to an embodiment, a semiconductor device includes a semiconductor element that is formed on a semiconductor substrate, an interlayer insulating film, including a silicon oxide film, that is formed to cover the semiconductor element, a wiring layer, including a metal, that is formed in the interlayer insulating film, and a first metal silicide film that is formed between the wiring layer and the interlayer insulating film.