METHOD OF FORMING SEMICONDUCTOR FINS

Embodiments of the present invention provide methods of removing fin portions from a finFET. At a starting point, a high-K dielectric layer is disposed on a substrate. A fin hardmask and lithography stack is deposited on the high-k dielectric. A fin hardmask is exposed, and a first portion of the fi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHOI DAE-HAN, HARIHARAPUTHIRAN MARIAPPAN, YANG DAE GEUN, WEI ANDY CHIH-HUNG, HU XIANG
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:Embodiments of the present invention provide methods of removing fin portions from a finFET. At a starting point, a high-K dielectric layer is disposed on a substrate. A fin hardmask and lithography stack is deposited on the high-k dielectric. A fin hardmask is exposed, and a first portion of the fin hardmark is removed. The lithography stack is removed. A second portion of the fin hardmask is removed. Fins are formed. A gap fill dielectric is deposited and recessed.