EXPOSURE MANAGEMENT SYSTEM

An exposure management system according to an embodiment includes a processing circuitry. The processing circuitry is configured to calculate a deviation index related to a difference between a target exposure index indicating an index of an exposure value that is set as a target of an X-ray image t...

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Bibliographische Detailangaben
Hauptverfasser:	NAGAI SEIICHIROU, KOTANI ATSUSHI, SUGAWARA YASUHIRO, YASHIRO SHOJI, ICHIKAWA TSUTOMU, OOHASHI TOSHIKATSU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS HEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATIONTECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING ORPROCESSING OF MEDICAL OR HEALTHCARE DATA IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING X-RAY TECHNIQUE
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Beschreibung
Zusammenfassung:	An exposure management system according to an embodiment includes a processing circuitry. The processing circuitry is configured to calculate a deviation index related to a difference between a target exposure index indicating an index of an exposure value that is set as a target of an X-ray image taking process and an image-taking-period exposure index indicating an index of an exposure value observed during the X-ray image taking process. The processing circuitry is configured to control so as to cause a display device to display history information from a predetermined time period indicating at least one selected from between image-taking-period exposure indices and deviation indices.